Robust Control for the Detection Threshold of CFAR Process in Cluttered Environments.

Shin, Jeong Hoon; Choi, Youngjin

Shin, Jeong Hoon; Choi, Youngjin.

Afiliação

Shin JH; 1st Research and Development Institute, Agency for Defense Development, Daejeon 34060, Korea.
Choi Y; Department of Electronic Systems Engineering, Hanyang University, Ansan 15588, Korea.

Sensors (Basel) ; 20(14)2020 Jul 13.

Article em En | MEDLINE | ID: mdl-32668801

Palavras-chave

CFAR process; clutter measurement density; probability of target existence; robust control

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Texto completo: 1 Bases de dados: MEDLINE Tipo de estudo: Diagnostic_studies Idioma: En Revista: Sensors (Basel) Ano de publicação: 2020 Tipo de documento: Article