Investigation of switching uniformity in resistive memory via finite element simulation of conductive-filament formation.

Min, Kyunghwan; Jung, Dongmyung; Kwon, Yongwoo.

Afiliação

Min K; Department of Materials Science and Engineering, Hongik University, Seoul, 04066, Korea.
Jung D; Department of Materials Science and Engineering, Hongik University, Seoul, 04066, Korea.
Kwon Y; Department of Materials Science and Engineering, Hongik University, Seoul, 04066, Korea. ykwon722@hongik.ac.kr.

Sci Rep ; 11(1): 2447, 2021 Jan 28.

Article em En | MEDLINE | ID: mdl-33510234

Texto completo: 1 Bases de dados: MEDLINE Idioma: En Revista: Sci Rep Ano de publicação: 2021 Tipo de documento: Article

Texto completo: 1 Bases de dados: MEDLINE Idioma: En Revista: Sci Rep Ano de publicação: 2021 Tipo de documento: Article