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Broad background in electron diffraction of 2D materials as a signature of their superior quality.
Petrovic, Marin; Meyer Zu Heringdorf, Frank J; Hoegen, Michael Horn-von; Thiel, Patricia A; Tringides, Michael C.
Afiliação
  • Petrovic M; Center of Excellence for Advanced Materials and Sensing Devices, Institute of Physics, Bijenicka cesta 46, HR-10000, Zagreb, Croatia.
  • Meyer Zu Heringdorf FJ; Department of Physics and Center for Nanointegration CENIDE, University of Duisburg-Essen, Lotharstrasse 1, D-47057 Duisburg, Germany.
  • Hoegen MH; Department of Physics and Center for Nanointegration CENIDE, University of Duisburg-Essen, Lotharstrasse 1, D-47057 Duisburg, Germany.
  • Thiel PA; Department of Physics and Center for Nanointegration CENIDE, University of Duisburg-Essen, Lotharstrasse 1, D-47057 Duisburg, Germany.
  • Tringides MC; Ames Laboratory - U.S. Department of Energy, Ames, IA 50011, United States of America.
Nanotechnology ; 32(50)2021 Sep 27.
Article em En | MEDLINE | ID: mdl-34492653

Texto completo: 1 Bases de dados: MEDLINE Idioma: En Revista: Nanotechnology Ano de publicação: 2021 Tipo de documento: Article País de afiliação: Croácia

Texto completo: 1 Bases de dados: MEDLINE Idioma: En Revista: Nanotechnology Ano de publicação: 2021 Tipo de documento: Article País de afiliação: Croácia