Origins of the variability of the electrical characteristics of solution-processed carbon nanotube thin-film transistors and integrated circuits.

Hirotani, Jun; Kishimoto, Shigeru; Ohno, Yutaka

Hirotani, Jun; Kishimoto, Shigeru; Ohno, Yutaka.

Afiliação

Hirotani J; Department of Electronics, Nagoya University Furo-cho, Chikusa-ku Nagoya 464-8603 Japan yohno@nagoya-u.jp.
Kishimoto S; Department of Electronics, Nagoya University Furo-cho, Chikusa-ku Nagoya 464-8603 Japan yohno@nagoya-u.jp.
Ohno Y; Department of Electronics, Nagoya University Furo-cho, Chikusa-ku Nagoya 464-8603 Japan yohno@nagoya-u.jp.

Nanoscale Adv ; 1(2): 636-642, 2019 Feb 12.

Article em En | MEDLINE | ID: mdl-36132255

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Texto completo: 1 Bases de dados: MEDLINE Idioma: En Revista: Nanoscale Adv Ano de publicação: 2019 Tipo de documento: Article