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An On-Chip Microscale Vacuum Chamber with High Sealing Performance Using Graphene as Lateral Feedthrough.
Yu, Panpan; Zhan, Fangyuan; Rao, Weidong; Zhao, Yanqing; Fang, Zheng; Tu, Zidong; Li, Zhiwei; Guo, Dengzhu; Wei, Xianlong.
Afiliação
  • Yu P; Hunan Institute of Advanced Sensing and Information Technology, Xiangtan University, Xiangtan 411105, China.
  • Zhan F; School of Electronics, Peking University, Beijing 100871, China.
  • Rao W; School of Electronics, Peking University, Beijing 100871, China.
  • Zhao Y; School of Electronics, Peking University, Beijing 100871, China.
  • Fang Z; School of Electronics, Peking University, Beijing 100871, China.
  • Tu Z; Hunan Institute of Advanced Sensing and Information Technology, Xiangtan University, Xiangtan 411105, China.
  • Li Z; School of Electronics, Peking University, Beijing 100871, China.
  • Guo D; School of Electronics, Peking University, Beijing 100871, China.
  • Wei X; School of Electronics, Peking University, Beijing 100871, China.
Micromachines (Basel) ; 14(1)2022 Dec 29.
Article em En | MEDLINE | ID: mdl-36677145
ABSTRACT
On-chip microscale vacuum chambers with high sealing performance and electrical feedthroughs are highly desired for microscale vacuum electronic devices and other MEMS devices. In this paper, we report an on-chip microscale vacuum chamber which achieves a high sealing performance by using monolayer graphene as lateral electrical feedthrough. A vacuum chamber with the dimensions of π × 2 mm × 2 mm × 0.5 mm is fabricated by anodically bonding a glass chip with a through-hole between two Si chips in a vacuum, after monolayer graphene electrodes have been transferred to the surface of one of the Si chips. Benefiting from the atomic thickness of monolayer graphene, the leak rate of Si-glass bonding interface with a monolayer graphene feedthrough is measured at less than 2 × 10-11 Pa·m3/s. The monolayer graphene feedthrough exhibits a minor resistance increase from 22.5 Ω to 31 Ω after anodic bonding, showing good electrical conductance. The pressure of the vacuum chamber is estimated to be 185 Pa by measuring the breakdown voltage. Such a vacuum is found to maintain for more than 50 days without obvious degradation, implying a high sealing performance with a leak rate of less than 1.02 × 10-16 Pa·m3/s.
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Texto completo: 1 Bases de dados: MEDLINE Idioma: En Revista: Micromachines (Basel) Ano de publicação: 2022 Tipo de documento: Article País de afiliação: China

Texto completo: 1 Bases de dados: MEDLINE Idioma: En Revista: Micromachines (Basel) Ano de publicação: 2022 Tipo de documento: Article País de afiliação: China