Electrical programmable multilevel nonvolatile photonic random-access memory.

Meng, Jiawei; Gui, Yaliang; Nouri, Behrouz Movahhed; Ma, Xiaoxuan; Zhang, Yifei; Popescu, Cosmin-Constantin; Kang, Myungkoo; Miscuglio, Mario; Peserico, Nicola; Richardson, Kathleen; Hu, Juejun; Dalir, Hamed; Sorger, Volker J

Meng, Jiawei; Gui, Yaliang; Nouri, Behrouz Movahhed; Ma, Xiaoxuan; Zhang, Yifei; Popescu, Cosmin-Constantin; Kang, Myungkoo; Miscuglio, Mario; Peserico, Nicola; Richardson, Kathleen; Hu, Juejun; Dalir, Hamed; Sorger, Volker J.

Afiliação

Meng J; Department of Electrical and Computer Engineering, George Washington University, Washington DC, 20052, USA.
Gui Y; Department of Electrical and Computer Engineering, George Washington University, Washington DC, 20052, USA.
Nouri BM; Department of Electrical and Computer Engineering, George Washington University, Washington DC, 20052, USA.
Ma X; Department of Electrical and Computer Engineering, George Washington University, Washington DC, 20052, USA.
Zhang Y; Department of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
Popescu CC; Department of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
Kang M; CREOL, The College of Optics & Photonics, University of Central Florida, Orlando, FL, 32816, USA.
Miscuglio M; Department of Electrical and Computer Engineering, George Washington University, Washington DC, 20052, USA.
Peserico N; Department of Electrical and Computer Engineering, George Washington University, Washington DC, 20052, USA.
Richardson K; Florida Semiconductor Institute, University of Florida, Gainesville, FL, 32603, USA.
Hu J; Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, 32603, USA.
Dalir H; CREOL, The College of Optics & Photonics, University of Central Florida, Orlando, FL, 32816, USA.
Sorger VJ; Department of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.

Light Sci Appl ; 12(1): 189, 2023 Aug 01.

Article em En | MEDLINE | ID: mdl-37528100

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Texto completo: 1 Bases de dados: MEDLINE Tipo de estudo: Clinical_trials Idioma: En Revista: Light Sci Appl Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Estados Unidos

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