Clutter Effect Investigation on Co-Polarized Chipless RFID Tags and Mitigation Using Cross-Polarized Tags, Analytical Model, Simulation, and Measurement.

Alam, Jahangir; Khaliel, Maher; Zheng, Feng; Solbach, Klaus; Kaiser, Thomas

Alam, Jahangir; Khaliel, Maher; Zheng, Feng; Solbach, Klaus; Kaiser, Thomas.

Afiliação

Alam J; Institute of Digital-Signal Processing, University of Duisburg-Essen, 47057 Duisburg, Germany.
Khaliel M; Institute of Digital-Signal Processing, University of Duisburg-Essen, 47057 Duisburg, Germany.
Zheng F; Benha Faculty of Engineering, Benha University, Benha 13511, Egypt.
Solbach K; Institute of Digital-Signal Processing, University of Duisburg-Essen, 47057 Duisburg, Germany.
Kaiser T; Institute of Digital-Signal Processing, University of Duisburg-Essen, 47057 Duisburg, Germany.

Sensors (Basel) ; 23(17)2023 Aug 31.

Article em En | MEDLINE | ID: mdl-37688017

Palavras-chave

RCS-based cross-polarized tag; analytical model; chipless RFID; clutter; measurement; simulation

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Texto completo: 1 Bases de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Revista: Sensors (Basel) Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Alemanha

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