Tight focusing of laser light using a chromium Fresnel zone plate.

Using near-field scanning microscopy, we demonstrate that a 15-µm zone plate fabricated in a 70-nm chromium film sputtered on a glass substrate and having a focal length and outermost zone's width equal to the incident wavelength λ = 532 nm, focuses a circularly polarized Gaussian beam into a circular subwavelength focal spot whose diameter at the full-width of half-maximum intensity is FWHM = 0.47λ. This value is in near-accurate agreement with the FDTD-aided numerical estimate of FWHM = 0.46λ. When focusing a Gaussian beam linearly polarized along the y-axis, an elliptic subwavelength focal spot is experimentally found to measure FWHMx = 0.42λ (estimated value FWHMx = 0.40λ) and FWHMy = 0.64λ. The subwavelength focal spots presented here are the tightest among all attained so far for homogeneously polarized beams by use of non-immersion amplitude zone plates.

Thin high numerical aperture metalens.

We designed, fabricated, and characterized a thin metalens in an amorphous silicon film of diameter 30 µm, focal length equal to the incident wavelength 633 nm. The lens is capable of simultaneously manipulating the state of polarization and phase of incident light. The lens converts a linearly polarized beam into radially polarized light, producing a subwavelength focus. When illuminated with a linearly polarized Gaussian beam, the lens produces a focal spot whose size at full-width half-maximum intensity is 0.49λ and 0.55λ (λ is incident wavelength). The experimental results are in good agreement with the numerical simulation, with the simulated focal spot measuring 0.46λ and 0.52λ. This focal spot is less than all other focal spots obtained using metalenses.

Microlens-aided focusing of linearly and azimuthally polarized laser light.

We have investigated a four-sector transmission polarization converter (4-SPC) for a wavelength of 633 nm, that enables the conversion of a linearly polarized incident beam into a mixture of linearly and azimuthally polarized beams. It was numerically shown that by placing a Fresnel zone plate of focal length 532 nm immediately after the 4-SPC, the incident light can be focused into an oblong subwavelength focal spot whose size is smaller than the diffraction limit (with width and breadth, respectively, measuring FWHM = 0.28λ and FWHM = 0.45λ, where λ is the incident wavelength and FWHM stands for full-width at half maximum of the intensity). After passing through the 4-SPC, light propagates in free space over a distance of 300 µm before being focused by a Fresnel zone plate (ZP), resulting in focal spot measuring 0.42λ and 0.81λ. The focal spot was measured by a near-field microscope SNOM, and the transverse E-field component of the focal spot was calculated to be 0.42λ and 0.59λ. This numerical result was verified experimentally, giving a focal spot of smaller and larger size, respectively, measuring 0.46λ and 0.57λ. To our knowledge, this is the first implementation of polarization conversion and subwavelength focusing of light using a pair of transmission micro-optic elements.

Tight focusing with a binary microaxicon.

Using a near-field scanning microscope (NT-MDT) with a 100 nm aperture cantilever held 1 µm apart from a microaxicon of diameter 14 µm and period 800 nm, we measure a focal spot resulting from the illumination by a linearly polarized laser light of wavelength λ=532 nm, with its FWHM being equal to 0.58λ, and the depth of focus being 5.6λ. The rms deviation of the focal spot intensity from the calculated value is 6%. The focus intensity is five times larger than the maximal illumination beam intensity.