Characterisation of the interplay between microstructure and opto-electronic properties of Cu(In,Ga)S2solar cells by using correlative CL-EBSD measurements.

Cathodoluminescence and electron backscatter diffraction have been applied to exactly the same grain boundaries (GBs) in a Cu(In,Ga)S2solar absorber in order to investigate the influence of microstructure on the radiative recombination behaviour at the GBs. Two different types of GB with different microstructure were analysed in detail: random high angle grain boundaries (RHAGBs) and Σ3 GBs. We found that the radiative recombination at all RHAGBs was inhibited to some extent, whereas at Σ3 GBs three different observations were made: unchanged, hindered, or promoted radiative recombination. These distinct behaviours may be linked to atomic-scale grain boundary structural differences. The majority of GBs also exhibited a small spectral shift of about ±10 meV relative to the local grain interior (GI) and a few of them showed spectral shifts of up to ±40 meV. Red and blue shifts were observed with roughly equal frequency.

Imaging and Segmenting Grains and Subgrains Using Backscattered Electron Techniques.

We present two new methods of processing data from backscattered electron signals in a scanning electron microscope to image grains and subgrains. The first combines data from multiple backscattered electron images acquired at different specimen geometries to (1) better reveal grain boundaries in recrystallized microstructures and (2) distinguish between recrystallized and unrecrystallized regions in partially recrystallized microstructures. The second utilizes spherical harmonic transform indexing of electron backscatter diffraction patterns to produce high angular resolution orientation data that enable the characterization of subgrains. Subgrains are produced during high-temperature plastic deformation and have boundary misorientation angles ranging from a few degrees down to a few hundredths of a degree. We also present an algorithm to automatically segment grains from combined backscattered electron image data or grains and subgrains from high angular resolution electron backscatter diffraction data. Together, these new techniques enable rapid measurements of individual grains and subgrains from large populations.

Automatic Texture Alignment by Optimization Method.

Microstructure analysis via electron backscatter diffraction has become an indispensable tool in materials science and engineering. In order to interpret or predict the anisotropy in crystalline materials, the texture is assessed, e.g. via pole figure diagrams. To ensure a correct characterization, it is crucial to align the measured sample axes as closely as possible with the manufacturing process directions. However, deviations are inevitable due to sample preparation and manual measurement setup. Postprocessing is mostly done manually, which is tedious and operator-dependent. In this work, it is shown that the deviation can be calculated using the contour of the crystal orientations. This can also be utilized to define the axis symmetry of pole figure diagrams through an objective function, allowing for symmetric alignment by minimization. Experimental textures of extruded profiles and synthetically generated textures were used to demonstrate the general applicability of the method. It has proven to work excellently for deviations of up to 5∘, which are typical for careful manual sample preparation and mounting. While the performance of the algorithm is reduced with increasing misalignment, good results have also been obtained for deviations up to 15∘.

A new method for calculating interplanar spacing to distinguish between similar phases in EBSD.

Commercial electron backscatter diffraction (EBSD) systems generally use interplanar angle matching for pattern indexing, and thus, they are unable to distinguish between some similar phases with close interplanar angles, such as Al and Si. The interplanar spacing is more diagnostic but generally difficult to apply in pattern indexing because it lacks precision. In this study, we proposed an efficient approach for accurately measuring interplanar spacing by correcting the reciprocal-lattice vector (RLV). The phase discrimination of Al and Si was performed by interplanar spacing matching. The Kikuchi bands were identified automatically by the self-developed method using pattern rotation combined with grey gradient recognition without the help of human eyes. The reliable RLV relationship was extracted by accurately drawing reciprocal-lattice vectors. The lengths of RLVs were corrected, and then the RLVs were used for evaluating lattice spacing. The results of five Kikuchi patterns with different clarity showed that this new method reduced the average error of interplanar spacings by 50.611% and achieved an average accuracy of 1.644% for lattice spacing calculation. The method could distinguish structures with a difference in lattice spacing of at least 3.3%. This method was also effective for fuzzy patterns and partially missing Kikuchi bands and might be used as a new strategy for improving the calculation accuracy of lattice spacing for fuzzy patterns. The method did not have additional requirements concerning the number of detected Kikuchi bands and poles. The accuracy of lattice spacing could be effectively improved by correcting the RLVs based on routine pattern recognition. This method might be used as an auxiliary approach to differentiate between similar phases and is well-adapted to the existing commercial EBSD system.

The structure of the eggshell and eggshell membranes of Crocodylus niloticus.

The macro- and microstructure, elemental composition, and crystallographic characteristics of the eggshell and eggshell membranes of the Crocodylus niloticus egg was investigated using optical and electron microscopy, energy-dispersive X-ray spectroscopy (EDS), electron backscatter diffraction (EBSD) and computerised tomography. The translucent ellipsoid egg is composed of two basic layers, the outer calcified layer referred to as the shell and an inner organic fibre layer, referred to as the shell membrane. The outer inorganic calcite shell is further divided into an external, palisade and mammillary layers with pore channels traversing the shell. The external layer is a thin layer of amorphous calcium and phosphorus, the underlying palisade layer consist of irregular wedge-shaped crystals composed calcite with traces of magnesium, sodium, sulphur and phosphorus. The crystals are mostly elongated, orientated perpendicular to the shell surface ending in cone-shaped knobs, which forms the inner mammillary layer. The elemental composition of the mammillae is like that of the palisade layer, but the crystal structure is much smaller and orientated randomly. The highest number of mammillae and shell pores are found at the equator of the egg, becoming fewer towards the egg poles. The shell thickness follows the same pattern, with the thickest area located at the equator. The eggshell membrane located right beneath and embedded in the mammillary layer of the shell; it is made up of unorganised fibre sheets roughly orientated at right angles to one another. Individual fibres consist of numerous smaller fibrils forming open channels that run longitudinally through the fibre.

Facet type determination based on combined atomic force microscopy and electron backscatter diffraction.

The distribution of facet types affects the functionality of the surfaces of polycrystalline films. However, we are not aware of a previously published convenient method to determine their distribution. This work describes and demonstrates a process to determine and map the Miller indexes (hkl) of crystal facets exposed at the surfaces of polycrystalline films. To find facet types in non-trivial cases, one must know the orientation of the crystal and the direction in which the facet is facing. The method presented here combines the crystal orientations obtained with electron backscatter diffraction with the topography of the same sample area measured with atomic force microscopy. A challenging step is to transfer the data from the two instruments into a common coordinate system. The sequence of steps in the data processing is presented, with methods to verify the results. The process is illustrated with the analysis of an etched copper clad laminate (CCL) and an electroless Cu film deposited on the CCL. This example relates to facet selection in electroless and galvanic plating processes in printed circuit board production, where an uncontrolled transition from epitaxial to non-epitaxial growth can lead to surfaces with unacceptable roughness.

Thermoelectric response from grain boundaries and lattice distortions in crystalline gold devices.

The electronic Seebeck response in a conductor involves the energy-dependent mean free path of the charge carriers and is affected by crystal structure, scattering from boundaries and defects, and strain. Previous photothermoelectric (PTE) studies have suggested that the thermoelectric properties of polycrystalline metal nanowires are related to grain structure, although direct evidence linking crystal microstructure to the PTE response is difficult to elucidate. Here, we show that room temperature scanning PTE measurements are sensitive probes that can detect subtle changes in the local Seebeck coefficient of gold tied to the underlying defects and strain that mediate crystal deformation. This connection is revealed through a combination of scanning PTE and electron microscopy measurements of single-crystal and bicrystal gold microscale devices. Unexpectedly, the photovoltage maps strongly correlate with gradually varying crystallographic misorientations detected by electron backscatter diffraction. The effects of individual grain boundaries and differing grain orientations on the PTE signal are minimal. This scanning PTE technique shows promise for identifying minor structural distortions in nanoscale materials and devices.

Transmission Kikuchi Diffraction Mapping Induces Structural Damage in Atom Probe Specimens.

Measuring local chemistry of specific crystallographic features by atom probe tomography (APT) is facilitated by using transmission Kikuchi diffraction (TKD) to help position them sufficiently close to the apex of the needle-shaped specimen. However, possible structural damage associated to the energetic electrons used to perform TKD is rarely considered and is hence not well-understood. Here, in two case studies, we evidence damage in APT specimens from TKD mapping. First, we analyze a solid solution, metastable ß-Ti-12Mo alloy, in which the Mo is expected to be homogenously distributed. Following TKD, APT reveals a planar segregation of Mo among other elements. Second, specimens were prepared near Σ3 twin boundaries in a high manganese twinning-induced plasticity steel, and subsequently charged with deuterium gas. Beyond a similar planar segregation, voids containing a high concentration of deuterium, i.e., bubbles, are detected in the specimen on which TKD was performed. Both examples showcase damage from TKD mapping leading to artefacts in the distribution of solutes. We propose that the structural damage is created by surface species, including H and C, subjected to recoil from incoming energetic electrons during mapping, thereby getting implanted and causing cascades of structural damage in the sample.

Comparison of Laboratory Diffraction Contrast Tomography and Electron Backscatter Diffraction Results: Application to Naturally Occurring Chromites.

Understanding how minerals are spatially distributed within natural materials and their textures is indispensable to understanding the fundamental processes of how these materials form and how they will behave from a mining engineering perspective. In the past few years, laboratory diffraction contrast tomography (LabDCT) has emerged as a nondestructive technique for 3D mapping of crystallographic orientations in polycrystalline samples. In this study, we demonstrate the application of LabDCT on both chromite sand and a complex chromitite sample from the Merensky Reef (Bushveld Complex, South Africa). Both samples were scanned using LabDCT and Electron Backscatter Diffraction (EBSD), and the obtained results were rigorously evaluated using a comprehensive set of qualitative and quantitative characterization techniques. The quality of LabDCT results was accessed by using the "completeness" value, while the inaccuracies were thoroughly discussed, along with proposed potential solutions. The results indicate that the grain orientations obtained from LabDCT are comparable to that of 2D EBSD but have the advantage of collecting true 3D size, shape, and textural information. This study highlights the significant contribution of LabDCT in the understanding of complex rock materials from an earth science perspective, particularly in characterizing mineral texture and crystallography in 3D.

Statistical Comparison of Substructures in Pure Aluminum Before and After Creep Deformation, Based on EBSD Image Data.

Electron backscatter diffraction (EBSD) images of extruded pure aluminum were statistically analyzed to investigate creep-induced subgrain structures after applying two different levels of creep stress, corresponding to the power law (PL) and power-law breakdown (PLB) regimes. Kernel average misorientation analysis of EBSD measurements revealed 2D morphologies, which were subdivided by a multi-step segmentation procedure into subgranular arrangements. Various descriptors were employed to characterize the "subgrains" quantitatively, including their size, shape, spatial arrangement, and crystallographic orientation. In particular, the analysis of the orientations of subgrains was conducted by neglecting rotations around the loading axis. This approach facilitated the individual investigation of the {001} and {111} subgrain families with respect to the loading axis for two investigated stress levels plus a reference specimen. For the PL regime, the statistical analysis of subgrain descriptors computed from segmented image data revealed a similar degree of strain accumulation for {111} and {001} subgrains. In contrast, for the PLB regime, the analyzed descriptors indicate that {111} subgrains tend to accumulate significantly more strain than {001} ones. These observations suggest that the mechanisms leading to PLB may be associated with strain localization dependent on intergranular stress, hindering the recovery process within {111} grains.

Quantification of Slip Band Distribution in Polycrystals: An Automated Fast Fourier Transform Decomposition Approach.

Plastic deformation is accumulated in slip bands in a wide variety of engineering alloys. Multiple material and loading conditions impact their distribution and degree of slip localization, but these effects are rarely quantified. To tackle this, the current work introduces a fast Fourier transform (FFT) decomposition method and applies it to a tensile-loaded polycrystalline nickel-based superalloy imaged via high-resolution digital image correlation and electron backscatter diffraction. This approach identifies active slip planes over the FFT images of individual grains and performs inverse transforms such that slip band traces with shared orientations are isolated. This technique enabled the largest quantification of slip band spacings and in-plane strains to date, with a total of 6,557 slip bands detected. The results show that the slip band spacings increase with grain size, with no evident dependence on grain orientation and Schmid factor. Slip bands are found to develop similar spacings along different octahedral planes and continue to spread over larger regions of the grain as the resolved shear stress of the active slip system increases. The FFT decomposition technique, which could be employed with multiple microscopy techniques, will allow for much-needed large-scale quantitative studies of slip localization.

Generalized pole figures from post-processing whole Debye-Scherrer patterns for microstructural analysis on deformed materials.

Debye-Scherrer patterns, obtained from X-ray diffraction experiments using synchrotron light in transmission geometry, were analysed to construct generalized pole figures, and further used as input for an orientation distribution function inversion algorithm. By using Langford's method for separating strain and size contributions to peak broadening, it was possible, for the first time, to obtain full domain size and dislocation density generalized distribution functions (GDFs). This method was applied to cold-rolled and annealed interstitial-free steel. The predictions made using GDFs were corroborated by electron backscatter diffraction measurements and were also consistent with what was previously known for this kind of material under these conditions.

Conditions near a crack tip: Advanced experiments for dislocation analysis and local strain measurement.

The local stress state and microstructure near the crack-tip singularity control the fracture process. In ductile materials multiple toughening mechanisms are at play that dynamically influence stress and microstructure at the crack tip. In metals, crack-tip shielding is typically associated with the emission of dislocations. Therefore, to understand crack propagation on the most fundamental level, in situ techniques are required that are capable to combine imaging and stress mapping at high resolution. Recent experimental advances in x-ray diffraction, scanning electron microscopy, and transmission electron microscopy enable quantifying deformation stress fields from the bulk level down to the individual dislocation. Furthermore, through modern detector technology the temporal resolution has sufficiently improved to enable stress mapping during in situ experiments.

Automatic detection of Kikuchi bands based on Radon transform and PPHT.

The information of crystal structure and orientation can be provided by analysing the EBSD (electron backscatter diffraction) patterns which are obtained with the EBSD devices. The reliability and accuracy of the information relies on the location of bands and intersections of the EBSD patterns. In this study, a method is proposed to automatically obtain the locations and intersections of the EBSD patterns, that is, Kikuchi bands. The proposed method uses Radon transform and progressive probabilistic Hough transform to detect straight lines and line segments of the Kikuchi band edges, respectively. Then, Kikuchi bands can be presented by fitting the hyperbolas with the endpoints of line segments. The results can numerically describe the information of Kikuchi bands. Experimental results show that the method is robust and can detect more accurate Kikuchi bands and intersections.

In this paper, a novel method is proposed to detect the electron backscatter diffraction patterns. Electron backscatter diffraction patterns are a class images consisting of multiple parallel lines of light and dark pairs. The bands on the image can reflect the information of crystal structure and orientation. Most existing methods are complex to implement and computationally intensive in detecting edges and intersections of bands. Therefore, we designed a fast and easy-to-implement detection method with relatively good accuracy to overcome the drawbacks of existing methods. Our method is based on straight line detection and line segment detection. After matching the straight line detection results and the line segment detection results, the edges are obtained by fitting the line segment endpoints using a hyperbola, and the intersections are obtained by using centerline positioning. Experiments have shown that our method has good accuracy and can detect less perfect patterns . In addition, our method is easy to implement and and is valuable for computationally constrained cases.

A Pattern Processing Method to Map Nanoscale Phases by EBSD.

The crystallographic analysis of nanoscale phases with dimensions well below the spatial probing volume of electron backscatter diffraction (EBSD) traditionally rely on electron microscopy in transmission (either in SEM or TEM), because EBSD patterns are invariably dominated by the matrix phase contribution and present seemingly no trace from such nanoscale phases. Yet, this study shows that such nanoscale features generate a very faint but valuable secondary diffraction signal which can be retrieved. A diffraction pattern postprocessing method is presented which focuses on the detection of such secondary signal emitted by nanoscale minority phases in overlapped patterns dominated by a dominant matrix signal. The predominant, majority phase contribution in EBSD patterns is removed by a close-neighbor pattern subtraction routine, after which both the conventional Hough indexing method as well as pattern matching methods can be used to reveal the crystallography, spatial distribution, morphology, and orientation of nanoscale minority phases initially absent from EBSD maps. Nanolamellar pearlitic steel, which has long been out of reach for EBSD, has been chosen as an application example.

Al2O3 Grain Boundary Segregation in a Thermal Barrier Coating on a Ni-Based Superalloy.

The segregation of reactive elements (REs) along thermally grown oxide (TGO) grain boundaries has been associated to slower oxide growth kinetics and improved creep properties. However, the incorporation and diffusion of these elements into the TGO during oxidation of Ni alloys remains an open question. In this work, electron backscatter diffraction in transmission mode (t-EBSD) was used to investigate the microstructure of TGO within the thermal barrier coating on a Ni-based superalloy, and atom probe tomography (APT) was used to quantify the segregation behavior of REs to α-Al2O3 grain boundaries. Integrating the two techniques enables a higher level of site-specific analysis compared to the routine focused ion beam lift-out sample preparation method without t-EBSD. Needle-shaped APT specimens readily meet the thickness criterion for electron diffraction analysis. Transmission EBSD provides an immediate feedback on grain orientation and grain boundary location within the APT specimens to help target grain boundaries in the TGO. Segregation behavior of REs is discussed in terms of the grain boundary character and relative location in TGO.

Growth and Characterization of Graphene Layers on Different Kinds of Copper Surfaces.

Graphene films were grown by chemical vapor deposition on Cu foil. The obtained samples were characterized by Raman spectroscopy, ellipsometry, X-ray photoelectron spectroscopy and electron back-scatter diffraction. We discuss the time-dependent changes in the samples, estimate the thickness of emerging Cu2O beneath the graphene and check the orientation-dependent affinity to oxidation of distinct Cu grains, which also governs the manner in which the initial strong Cu-graphene coupling and strain in the graphene lattice is released. Effects of electropolishing on the quality and the Raman response of the grown graphene layers are studied by microtexture polarization analysis. The obtained data are compared with the Raman signal of graphene after transfer on glass substrate revealing the complex interaction of graphene with the Cu substrate.

Local Kikuchi band detection in electron backscatter diffraction patterns for enhanced pattern indexing.

Partially missing bands in the preset region for Hough transform might strongly affect the accuracy of indexing Kikuchi patterns and reduce the quality of electron backscatter diffraction (EBSD) maps. This paper proposes a novel local band detection method for such kind of low-quality patterns. The approach involves rotating bands to vertical direction, detecting the local line segments through calculating the largest horizontal average grey gradient with a constant interval of 400 pixels in vertical direction, and applying Hough transform as well as weighted averaging to these line clusters to unify the edges of Kikuchi band. Therefore, even if only part of a Kikuchi band is visible, the entire band can also be accurately extracted. The average interplanar angle error obtained by the proposed method is approximately 29.0% less than those obtained by Hough transform-based technique. Moreover, the comparison of mean angular deviation (MAD) is also discussed. The average MAD of this method is about 38.5% lower than that of Hough transform-based technique. Consequently, the local Kikuchi band detection method is expected to be used for post-processing and re-indexing the EBSD low-quality patterns.

Phase determination in dual phase steels via HREBSD-based tetragonality mapping.

Electron Backscatter Diffraction (EBSD) is a widely used approach for characterising the microstructure of various materials. However, it is difficult to accurately distinguish similar (body centred cubic and body centred tetragonal, with small tetragonality) phases in steels using standard EBSD software. One method to tackle the problem of phase distinction is to measure the tetragonality of the phases, which can be done using simulated patterns and cross-correlation techniques to detect distortion away from a perfectly cubic crystal lattice. However, small errors in the determination of microscope geometry (the so-called pattern or projection centre) can cause significant errors in tetragonality measurement and lead to erroneous results. This paper utilises a new approach for accurate pattern centre determination via a strain minimisation routine across a large number of grains in dual phase steels. Tetragonality maps are then produced and used to identify phase and estimate local carbon content. The technique is implemented using both kinetically simulated and dynamically simulated patterns to determine their relative accuracy. Tetragonality maps, and subsequent phase maps, based on dynamically simulated patterns in a point-by-point and grain average comparison are found to consistently produce more precise and accurate results, with close to 90% accuracy for grain phase identification, when compared with an image-quality identification method. The error in tetragonality measurements appears to be of the order of 1%, thus producing a commensurate ∼0.2% error in carbon content estimation. Such an error makes the technique unsuitable for estimation of total carbon content of most commercial steels, which often have carbon levels below 0.1%. However, even in the DP steel for this study (0.1 wt.% carbon) it can be used to map carbon in regions with higher accumulation (such as in martensite with nonhomogeneous carbon content). LAY DESCRIPTION: Electron Backscatter Diffraction (EBSD) is a widely used approach for characterising the microstructure of various materials. However, it is difficult to accurately distinguish similar (BCC and BCT) phases in steels using standard EBSD software due to the small difference in crystal structure. One method to tackle the problem of phase distinction is to measure the tetragonality, or apparent 'strain' in the crystal lattice, of the phases. This can be done by comparing experimental EBSD patterns with simulated patterns via cross-correlation techniques, to detect distortion away from a perfectly cubic crystal lattice. However, small errors in the determination of microscope geometry (the so-called pattern or projection centre) can cause significant errors in tetragonality measurement and lead to erroneous results. This paper utilises a new approach for accurate pattern centre determination via a strain minimisation routine across a large number of grains in dual phase steels. Tetragonality maps are then produced and used to identify phase and estimate local carbon content. The technique is implemented using both simple kinetically simulated and more complex dynamically simulated patterns to determine their relative accuracy. Tetragonality maps, and subsequent phase maps, based on dynamically simulated patterns in a point-by-point and grain average comparison are found to consistently produce more precise and accurate results, with close to 90% accuracy for grain phase identification, when compared with an image-quality identification method. The error in tetragonality measurements appears to be of the order of 1%, thus producing a commensurate error in carbon content estimation. Such an error makes an estimate of total carbon content particularly unsuitable for low carbon steels; although maps of local carbon content may still be revealing. Application of the method developed in this paper will lead to better understanding of the complex microstructures of steels, and the potential to design microstructures that deliver higher strength and ductility for common applications, such as vehicle components.

Quantitative analysis of compatible microstructure by electron backscatter diffraction.

We propose a scheme for assigning the martensite variant using electron backscatter diffraction in a martensite material that undergoes a solid-solid phase transformation. Based on the solutions of the crystallographic equations of martensite, we provide an algorithm to assign martensite variants to a particular microscopic region, and to check the elastic compatibility of the microstructure corresponding to low hysteresis and high reversibility in shape memory alloys. This article is part of the theme issue 'Topics in mathematical design of complex materials'.