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Elimination of cumulative effect of thickness errors in monochromatic monitoring of optical coating production: theory.
Tikhonravov, A V; Trubetskov, M K.
Afiliação
  • Tikhonravov AV; Research Computing Center, Moscow State University, Moscow, Russia. tikh@srcc.msu.ru
Appl Opt ; 46(11): 2084-90, 2007 Apr 10.
Article em En | MEDLINE | ID: mdl-17384724
ABSTRACT
We propose an algorithm for correcting deposition termination levels that allows elimination of the cumulative effect of errors in previously deposited layers. For the application of this algorithm at least one monitoring signal extremum should be registered during a layer deposition. We also derive a theoretical relation for the estimation of errors in layer refractive indices based on the results of on-line monitoring measurements. At least two monitoring signal extrema are required for its application.
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Base de dados: MEDLINE Idioma: En Ano de publicação: 2007 Tipo de documento: Article
Buscar no Google
Base de dados: MEDLINE Idioma: En Ano de publicação: 2007 Tipo de documento: Article