Surface determination through atomically resolved secondary-electron imaging.

Ciston, J; Brown, H G; D'Alfonso, A J; Koirala, P; Ophus, C; Lin, Y; Suzuki, Y; Inada, H; Zhu, Y; Allen, L J; Marks, L D.

Afiliação

Ciston J; National Center for Electron Microscopy, The Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA.
Brown HG; School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia.
D'Alfonso AJ; School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia.
Koirala P; Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, USA.
Ophus C; National Center for Electron Microscopy, The Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA.
Lin Y; Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, USA.
Suzuki Y; Application Development Department, Hitachi High Technologies Corp., Ibaraki 312-8504, Japan.
Inada H; Advanced Microscope Design Department, Hitachi High Technologies Corp., Ibaraki 312-8504, Japan.
Zhu Y; Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, New York 11973, USA.
Allen LJ; School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia.
Marks LD; Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, USA.

Nat Commun ; 6: 7358, 2015 Jun 17.

Article em En | MEDLINE | ID: mdl-26082275

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2015 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2015 Tipo de documento: Article