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Comparison of cross-sectional transmission electron microscope studies of thin germanium epilayers grown on differently oriented silicon wafers.
Norris, D J; Myronov, M; Leadley, D R; Walther, T.
Afiliação
  • Norris DJ; Kroto Centre for High-Resolution Imaging and Analysis, Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield, U.K.
  • Myronov M; Department of Physics, University of Warwick, Coventry, U.K.
  • Leadley DR; Department of Physics, University of Warwick, Coventry, U.K.
  • Walther T; Kroto Centre for High-Resolution Imaging and Analysis, Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield, U.K.
J Microsc ; 268(3): 288-297, 2017 12.
Article em En | MEDLINE | ID: mdl-28972660
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Texto completo: 1 Base de dados: MEDLINE Tipo de estudo: Prevalence_studies Idioma: En Ano de publicação: 2017 Tipo de documento: Article
Texto completo
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PubMed Links
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Texto completo: 1 Base de dados: MEDLINE Tipo de estudo: Prevalence_studies Idioma: En Ano de publicação: 2017 Tipo de documento: Article