Effect of UV and Water on Electrical Properties at Pre- and Post-Annealing Processes in Solution-Processed InGaZnO Transistors.

Kim, Young-Rae; Kwon, Jin-Hyuk; Vincent, Premkumar; Kim, Do-Kyung; Jeong, Hyeon-Seok; Hahn, Joonku; Bae, Jin-Hyuk.

Afiliação

Kim YR; School of Electronics Engineering, Kyungpook National University, Daegu 41566, Korea.
Kwon JH; School of Electronics Engineering, Kyungpook National University, Daegu 41566, Korea.
Vincent P; School of Electronics Engineering, Kyungpook National University, Daegu 41566, Korea.
Kim DK; School of Electronics Engineering, Kyungpook National University, Daegu 41566, Korea.
Jeong HS; School of Electronics Engineering, Kyungpook National University, Daegu 41566, Korea.
Hahn J; School of Electronics Engineering, Kyungpook National University, Daegu 41566, Korea.
Bae JH; School of Electronics Engineering, Kyungpook National University, Daegu 41566, Korea.

J Nanosci Nanotechnol ; 19(4): 2240-2246, 2019 Apr 01.

Article em En | MEDLINE | ID: mdl-30486976

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2019 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2019 Tipo de documento: Article