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Interface Sensitivity in Electron/Ion Yield X-ray Absorption Spectroscopy: The TiO2-H2O Interface.
van Spronsen, Matthijs A; Zhao, Xiao; Jaugstetter, Maximilian; Escudero, Carlos; Duchon, Tomás; Hunt, Adrian; Waluyo, Iradwikanari; Yang, Peidong; Tschulik, Kristina; Salmeron, Miquel B.
Afiliação
  • van Spronsen MA; Diamond Light Source Ltd., Didcot OX11 0DE, U.K.
  • Zhao X; Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States.
  • Jaugstetter M; Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States.
  • Escudero C; Department of Material Science & Engineering, University of California, Berkeley, California 94720, United States.
  • Duchon T; Department of Chemistry and Biochemistry, Ruhr-University-Bochum, 44780 Bochum, Germany.
  • Hunt A; ALBA Synchrotron Light Source, 08290 Cerdanyola del Vallès, Spain.
  • Waluyo I; Peter Grünberg Institute PGI-6, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany.
  • Yang P; National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973, United States.
  • Tschulik K; National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973, United States.
  • Salmeron MB; Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States.
J Phys Chem Lett ; 12(41): 10212-10217, 2021 Oct 21.
Article em En | MEDLINE | ID: mdl-34647748
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Texto completo: 1 Base de dados: MEDLINE Tipo de estudo: Diagnostic_studies Idioma: En Ano de publicação: 2021 Tipo de documento: Article
Texto completo
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XML
PubMed Links
Buscar no Google

Texto completo: 1 Base de dados: MEDLINE Tipo de estudo: Diagnostic_studies Idioma: En Ano de publicação: 2021 Tipo de documento: Article