Redox-controlled conductance of polyoxometalate molecular junctions.

Huez, Cécile; Guérin, David; Lenfant, Stéphane; Volatron, Florence; Calame, Michel; Perrin, Mickael L; Proust, Anna; Vuillaume, Dominique.

Afiliação

Huez C; Institute for Electronics Microelectronics and Nanotechnology (IEMN), CNRS, University of Lille, Av. Poincaré, Villeneuve d'Ascq, France. dominique.vuillaume@iemn.fr.
Guérin D; Institute for Electronics Microelectronics and Nanotechnology (IEMN), CNRS, University of Lille, Av. Poincaré, Villeneuve d'Ascq, France. dominique.vuillaume@iemn.fr.
Lenfant S; Institute for Electronics Microelectronics and Nanotechnology (IEMN), CNRS, University of Lille, Av. Poincaré, Villeneuve d'Ascq, France. dominique.vuillaume@iemn.fr.
Volatron F; Institut Parisien de Chimie Moléculaire (IPCM), CNRS, Sorbonne Université, 4 Place Jussieu, F-75005 Paris, France.
Calame M; EMPA, Transport at the Nanoscale Laboratory, 8600 Dübendorf, Switzerland.
Perrin ML; Dept. of Physics and Swiss Nanoscience Institute, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland.
Proust A; EMPA, Transport at the Nanoscale Laboratory, 8600 Dübendorf, Switzerland.
Vuillaume D; Department of Information Technology and Electrical Engineering, ETH Zurich, 8092 Zurich, Switzerland.

Nanoscale ; 14(37): 13790-13800, 2022 Sep 29.

Article em En | MEDLINE | ID: mdl-36102689

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2022 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2022 Tipo de documento: Article