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Defect Engineering in A2 BO4 Thin Films via Surface-Reconstructed LaSrAlO4 Substrates.
Kim, Jinkwon; Kim, Youngdo; Mun, Junsik; Choi, Woojin; Chang, Yunyeong; Kim, Jeong Rae; Gil, Byeongjun; Lee, Jong Hwa; Hahn, Sungsoo; Kim, Hongjoon; Chang, Seo Hyoung; Lee, Gun-Do; Kim, Miyoung; Kim, Changyoung; Noh, Tae Won.
Afiliação
  • Kim J; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 08826, Republic of Korea.
  • Kim Y; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, Republic of Korea.
  • Mun J; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 08826, Republic of Korea.
  • Choi W; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, Republic of Korea.
  • Chang Y; Department of Materials Science and Engineering and Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, Republic of Korea.
  • Kim JR; Department of Materials Science and Engineering and Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, Republic of Korea.
  • Gil B; Department of Materials Science and Engineering and Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, Republic of Korea.
  • Lee JH; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 08826, Republic of Korea.
  • Hahn S; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, Republic of Korea.
  • Kim H; Department of Materials Science and Engineering and Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, Republic of Korea.
  • Chang SH; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 08826, Republic of Korea.
  • Lee GD; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, Republic of Korea.
  • Kim M; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 08826, Republic of Korea.
  • Kim C; Department of Physics and Astronomy, Seoul National University, Seoul, 08826, Republic of Korea.
  • Noh TW; Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul, 08826, Republic of Korea.
Small Methods ; 6(11): e2200880, 2022 Nov.
Article em En | MEDLINE | ID: mdl-36250995

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2022 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2022 Tipo de documento: Article