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Self-limiting stoichiometry in SnSe thin films.
Chin, Jonathan R; Frye, Marshall B; Liu, Derrick Shao-Heng; Hilse, Maria; Graham, Ian C; Shallenberger, Jeffrey; Wang, Ke; Engel-Herbert, Roman; Wang, Mengyi; Shin, Yun Kyung; Nayir, Nadire; van Duin, Adri C T; Garten, Lauren M.
Afiliação
  • Chin JR; The School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0245, USA. lauren.garten@mse.gatech.edu.
  • Frye MB; The School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0245, USA. lauren.garten@mse.gatech.edu.
  • Liu DS; Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, USA.
  • Hilse M; Materials Research Institute, The Pennsylvania State University, University Park, Pennsylvania 16802, USA.
  • Graham IC; The School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0245, USA. lauren.garten@mse.gatech.edu.
  • Shallenberger J; Materials Research Institute, The Pennsylvania State University, University Park, Pennsylvania 16802, USA.
  • Wang K; Materials Research Institute, The Pennsylvania State University, University Park, Pennsylvania 16802, USA.
  • Engel-Herbert R; Paul-Drude Institut für Festkörperelektronik Berlin, Leibniz-Institut im Forschungsverbund Berlin eV., Berlin 10117, Germany.
  • Wang M; Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, USA.
  • Shin YK; Department of Mechanical Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, USA.
  • Nayir N; Department of Mechanical Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, USA.
  • van Duin ACT; Physics Department, Karamanoglu Mehmetbey University, Karaman, 70000, Turkey.
  • Garten LM; Department of Mechanical Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, USA.
Nanoscale ; 15(23): 9973-9984, 2023 Jun 15.
Article em En | MEDLINE | ID: mdl-37272496
Unique functionalities can arise when 2D materials are scaled down near the monolayer limit. However, in 2D materials with strong van der Waals bonds between layers, such as SnSe, maintaining stoichiometry while limiting vertical growth is difficult. Here, we describe how self-limiting stoichiometry can promote the growth of SnSe thin films deposited by molecular beam epitaxy. The Pnma phase of SnSe was stabilized over a broad range of Sn : Se flux ratios from 1 : 1 to 1 : 5. Changing the flux ratio does not affect the film stoichiometry, but influences the predominant crystallographic orientation. ReaxFF molecular dynamics (MD) simulation demonstrates that, while a mixture of Sn/Se stoichiometries forms initially, SnSe stabilizes as the cluster size evolves. The MD results further show that the excess selenium coalesces into Se clusters that weakly interact with the surface of the SnSe particles, leading to the limited stoichiometric change. Raman spectroscopy corroborates this model showing the initial formation of SnSe2 transitioning into SnSe as experimental film growth progresses. Transmission electron microscopy measurements taken on films deposited with growth rates above 0.25 Å s-1 show a thin layer of SnSe2 that disrupts the crystallographic orientation of the SnSe films. Therefore, using the conditions for self-limiting SnSe growth while avoiding the formation of SnSe2 was found to increase the lateral scale of the SnSe layers. Overall, self-limiting stoichiometry provides a promising avenue for maintaining growth of large lateral-scale SnSe for device fabrication.
Assuntos

Texto completo: 1 Base de dados: MEDLINE Assunto principal: Selênio / Simulação de Dinâmica Molecular Idioma: En Ano de publicação: 2023 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Assunto principal: Selênio / Simulação de Dinâmica Molecular Idioma: En Ano de publicação: 2023 Tipo de documento: Article