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Molecular Probing of the Microscopic Pressure at Contact Interfaces.
Hsu, Chao-Chun; Hsu, Allen Chu-Hsiang; Lin, Chun-Yen; Wong, Ken-Tsung; Bonn, Daniel; Brouwer, Albert M.
Afiliação
  • Hsu CC; van 't Hoff Institute for Molecular Sciences, University of Amsterdam, Science Park 904, 1098 XH Amsterdam, The Netherlands.
  • Hsu AC; Department of Chemistry, National Taiwan University, and Institute of Atomic and Molecular Science, Academia Sinica, Taipei 10617, Taiwan.
  • Lin CY; Department of Chemistry, National Taiwan University, and Institute of Atomic and Molecular Science, Academia Sinica, Taipei 10617, Taiwan.
  • Wong KT; Department of Chemistry, National Taiwan University, and Institute of Atomic and Molecular Science, Academia Sinica, Taipei 10617, Taiwan.
  • Bonn D; Van der Waals-Zeeman Institute, Institute of Physics, University of Amsterdam, Science Park 904, 1098 XH Amsterdam, The Netherlands.
  • Brouwer AM; van 't Hoff Institute for Molecular Sciences, University of Amsterdam, Science Park 904, 1098 XH Amsterdam, The Netherlands.
J Am Chem Soc ; 146(19): 13258-13265, 2024 May 15.
Article em En | MEDLINE | ID: mdl-38696718
ABSTRACT
Obtaining insights into friction at the nanoscopic level and being able to translate these into macroscopic friction behavior in real-world systems is of paramount importance in many contexts, ranging from transportation to high-precision technology and seismology. Since friction is controlled by the local pressure at the contact it is important to be able to detect both the real contact area and the nanoscopic local pressure distribution simultaneously. In this paper, we present a method that uses planarizable molecular probes in combination with fluorescence microscopy to achieve this goal. These probes, inherently twisted in their ground states, undergo planarization under the influence of pressure, leading to bathochromic and hyperchromic shifts of their UV-vis absorption band. This allows us to map the local pressure in mechanical contact from fluorescence by exciting the emission in the long-wavelength region of the absorption band. We demonstrate a linear relationship between fluorescence intensity and (simulated) pressure at the submicron scale. This relationship enables us to experimentally depict the pressure distribution in multiasperity contacts. The method presented here offers a new way of bridging friction studies of the nanoscale model systems and practical situations for which surface roughness plays a crucial role.

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2024 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2024 Tipo de documento: Article