Evaluation of Structural and Compositional Changes on the Root Surface Exposed to Diode Laser (810 nm): An In?vitro Study

Jayachandran, Dorairaj; Selvaraj, Sunantha; Priya, Shanmuga; Kukkamalla, Meena A.; Senkalvarayan, Vaishnavi.

Article | IMSEAR | ID: sea-222451

Mots clés

Stylus profilometer; scanning electron microscopy (SEM); energy?dispersive X?ray analysis (EDAX); compositional changes; ultrastructural changes

Texte intégral: 1 Indice: IMSEAR Année: 2023 Type: Article

Texte intégral: 1 Indice: IMSEAR Année: 2023 Type: Article