Analysis of binary classification repeated measurement data with GEE and GLMMs using SPSS software / 南方医科大学学报

ABSTRACT

<p><b>OBJECTIVE</b>To analyze binary classification repeated measurement data with generalized estimating equations (GEE) and generalized linear mixed models (GLMMs) using SPSS19.0.</p><p><b>METHODS</b>GEE and GLMMs models were tested using binary classification repeated measurement data sample using SPSS19.0.</p><p><b>RESULTS AND CONCLUSION</b>Compared with SAS, SPSS19.0 allowed convenient analysis of categorical repeated measurement data using GEE and GLMMs.</p>