A Thermally Activated Delayed Fluorescence Green OLED with 4500 h Lifetime and 20% External Quantum Efficiency by Optimizing the Emission Zone using a Single-Emission Spectrum Technique.

Device optimization of light-emitting diodes (LEDs) targets the most efficient conversion of electrically injected charges into emitted light. The emission zone in an LED is where charges recombine and light is emitted from. It is believed that the emission zone is strongly linked to device efficiency and lifetime. However, the emission zone size is below the optical diffraction limit, so it is difficult to measure. An accessible method based on a single emission spectrum that enables emission zone measurements with sub-second time resolution is shown. A procedure is introduced to study and control the emission zone of an LED system and correlate it with device performance. A thermally activated delayed fluorescence organic LED emission zone is experimentally measured over all luminescing current densities, while varying the device structure and while ageing. The emission zone is shown to be finely controlled by emitter doping because electron transport via the emitter is the charge-transport bottleneck of the system. Suspected quenching/degradation mechanisms are linked with the emission zone changes, device structure variation, and ageing. Using these findings, a device with an ultralong 4500 h T95 lifetime at 1000 cd m-2 with 20% external quantum efficiency is shown.

Influence of vacuum chamber impurities on the lifetime of organic light-emitting diodes.

We evaluated the influence of impurities in the vacuum chamber used for the fabrication of organic light-emitting diodes on the lifetime of the fabricated devices and found a correlation between lifetime and the device fabrication time. The contact angle of the ITO substrates stored the chamber under vacuum were used to evaluate chamber cleanliness. Liquid chromatography-mass spectrometry was performed on Si wafers stored in the vacuum chamber before device fabrication to examine the impurities in the chamber. Surprisingly, despite the chamber and evaporation sources being at room temperature, a variety of materials were detected, including previously deposited materials and plasticizers from the vacuum chamber components. We show that the impurities, and not differences in water content, in the chamber were the source of lifetime variations even when the duration of exposure to impurities only varied before and after deposition of the emitter layer. These results suggest that the impurities floating in the vacuum chamber significantly impact lifetime values and reproducibility.