Numerical study of the lateral resolution in electrostatic force microscopy for dielectric samples.

Riedel, C; Alegría, A; Schwartz, G A; Colmenero, J; Sáenz, J J.

Affiliation

Riedel C; Departamento de Física de Materiales UPV/EHU, Facultad de Química, Apartado 1072, 20080 San Sebastián, Spain. riedel@ies.univ-montp2.fr

Nanotechnology ; 22(28): 285705, 2011 Jul 15.

Article in En | MEDLINE | ID: mdl-21646694

Full text: 1 Database: MEDLINE Language: En Year: 2011 Type: Article

Full text: 1 Database: MEDLINE Language: En Year: 2011 Type: Article