Contrast inversion in electrostatic force microscopy imaging of trapped charges: tip-sample distance and dielectric constant dependence.

Riedel, C; Alegría, A; Arinero, R; Colmenero, J; Sáenz, J J.

Affiliation

Riedel C; Departamento de Física de Materiales UPV/EHU, Facultad de Química, Apartado 1072, 20080 San Sebastián, Spain. riedel@ies.univ-montp2.fr

Nanotechnology ; 22(34): 345702, 2011 Aug 26.

Article in En | MEDLINE | ID: mdl-21795775

Subject(s)

Microscopy, Atomic Force/methods; Computer Simulation; Models, Chemical; Static Electricity

Full text: 1 Database: MEDLINE Main subject: Microscopy, Atomic Force Language: En Year: 2011 Type: Article

Full text: 1 Database: MEDLINE Main subject: Microscopy, Atomic Force Language: En Year: 2011 Type: Article