K-shell spectroscopy of silicon ions as diagnostic for high electric fields.

Loetzsch, R; Jäckel, O; Höfer, S; Kämpfer, T; Polz, J; Uschmann, I; Kaluza, M C; Förster, E; Stambulchik, E; Kroupp, E; Maron, Y.

Affiliation

Loetzsch R; Helmholtz-Institut Jena, Helmholtzweg 4, D-07743 Jena, Germany. robert.loetzsch@uni-jena.de

Rev Sci Instrum ; 83(11): 113507, 2012 Nov.

Article in En | MEDLINE | ID: mdl-23206062

Full text: 1 Database: MEDLINE Type of study: Diagnostic_studies Language: En Year: 2012 Type: Article

Full text: 1 Database: MEDLINE Type of study: Diagnostic_studies Language: En Year: 2012 Type: Article