Pushing the limits: an instrument for hard X-ray imaging below 20 nm.
J Synchrotron Radiat
; 22(2): 336-41, 2015 Mar.
Article
in En
| MEDLINE
| ID: mdl-25723934
ABSTRACT
Hard X-ray microscopy is a prominent tool suitable for nanoscale-resolution non-destructive imaging of various materials used in different areas of science and technology. With an ongoing effort to push the 2D/3D imaging resolution down to 10â
nm in the hard X-ray regime, both the fabrication of nano-focusing optics and the stability of the microscope using those optics become extremely challenging. In this work a microscopy system designed and constructed to accommodate multilayer Laue lenses as nanofocusing optics is presented. The developed apparatus has been thoroughly characterized in terms of resolution and stability followed by imaging experiments at a synchrotron facility. Drift rates of â¼2â
nmâ
h(-1) accompanied by 13â
nm × 33â
nm imaging resolution at 11.8â
keV are reported.
Full text:
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Database:
MEDLINE
Language:
En
Year:
2015
Type:
Article