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Improved sensing characteristics of dual-gate transistor sensor using silicon nanowire arrays defined by nanoimprint lithography.
Lim, Cheol-Min; Lee, In-Kyu; Lee, Ki Joong; Oh, Young Kyoung; Shin, Yong-Beom; Cho, Won-Ju.
Affiliation
  • Lim CM; Department of Electronic Materials Engineering, Kwangwoon University , Seoul , Republic of Korea.
  • Lee IK; Hazards Monitoring BioNano Research Center, Korea Research Institute of Bioscience & Biotechnology (KRIBB) , Daejeon , Republic of Korea.
  • Lee KJ; Hazards Monitoring BioNano Research Center, Korea Research Institute of Bioscience & Biotechnology (KRIBB) , Daejeon , Republic of Korea.
  • Oh YK; Hazards Monitoring BioNano Research Center, Korea Research Institute of Bioscience & Biotechnology (KRIBB) , Daejeon , Republic of Korea.
  • Shin YB; Hazards Monitoring BioNano Research Center, Korea Research Institute of Bioscience & Biotechnology (KRIBB) , Daejeon , Republic of Korea.
  • Cho WJ; Department of Electronic Materials Engineering, Kwangwoon University , Seoul , Republic of Korea.
Sci Technol Adv Mater ; 18(1): 17-25, 2017.
Article in En | MEDLINE | ID: mdl-28179955