Spectral dependence of carrier lifetimes in silicon for photovoltaic applications.

Roller, John F; Li, Yu-Tai; Dagenais, Mario; Hamadani, Behrang H.

Affiliation

Roller JF; Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Li YT; PV Metrology Laboratory, Industrial Technology Research Institute, Chutung, Hsinchu 31040, Taiwan R.O.C.
Dagenais M; Department of Electrical and Computer Engineering, University of Maryland, College Park, MD, 20742, USA.
Hamadani BH; Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.

J Appl Phys ; 120(23)2016 12.

Article in En | MEDLINE | ID: mdl-28584383

Full text: 1 Database: MEDLINE Language: En Year: 2016 Type: Article

Full text: 1 Database: MEDLINE Language: En Year: 2016 Type: Article