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Grain size quantification by optical microscopy, electron backscatter diffraction, and magnetic force microscopy.
Chen, Hansheng; Yao, Yin; Warner, Jacob A; Qu, Jiangtao; Yun, Fan; Ye, Zhixiao; Ringer, Simon P; Zheng, Rongkun.
Affiliation
  • Chen H; School of Physics, The University of Sydney, NSW, 2006, Australia; Australian Institute for Nanoscale Science and Technology, The University of Sydney, Sydney, NSW 2006, Australia.
  • Yao Y; Electron Microscope Unit, Mark Wainwright Analytical Centre, The University of New South Wales, New South Wales, 2052, Australia.
  • Warner JA; Electron Microscope Unit, Mark Wainwright Analytical Centre, The University of New South Wales, New South Wales, 2052, Australia.
  • Qu J; School of Physics, The University of Sydney, NSW, 2006, Australia; Australian Institute for Nanoscale Science and Technology, The University of Sydney, Sydney, NSW 2006, Australia.
  • Yun F; School of Physics, The University of Sydney, NSW, 2006, Australia; Australian Institute for Nanoscale Science and Technology, The University of Sydney, Sydney, NSW 2006, Australia.
  • Ye Z; Hengdian Group DMEGC Magnetics Co. Ltd, Zhejiang, 322118, China.
  • Ringer SP; Australian Institute for Nanoscale Science and Technology, The University of Sydney, Sydney, NSW 2006, Australia; School of Aerospace, Mechanical and Mechatronic Engineering, The University of Sydney, Sydney, NSW 2006, Australia.
  • Zheng R; School of Physics, The University of Sydney, NSW, 2006, Australia; Australian Institute for Nanoscale Science and Technology, The University of Sydney, Sydney, NSW 2006, Australia. Electronic address: rongkun.zheng@sydney.edu.au.
Micron ; 101: 41-47, 2017 Oct.
Article in En | MEDLINE | ID: mdl-28622600
ABSTRACT
Quantification of microstructure, especially grain size, in polycrystalline materials is a vital aspect to understand the structure-property relationships in these materials. In this paper, representative characterization techniques for determining the grain size, including optical microscopy (OM), electron backscatter diffraction (EBSD) in the scanning electron microscopy (SEM), and atomic force microscopy/magnetic force microscopy (AFM/MFM), are thoroughly evaluated in comparison, illustrated by rare-earth sintered Nd-Fe-B permanent magnets. Potential applications and additional information achieved by using aforementioned characterization techniques have been discussed and summarized.
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Full text: 1 Database: MEDLINE Language: En Year: 2017 Type: Article
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Full text: 1 Database: MEDLINE Language: En Year: 2017 Type: Article