Structure diagnostics of heterostructures and multi-layered systems by X-ray multiple diffraction.
J Appl Crystallogr
; 50(Pt 3): 722-726, 2017 Jun 01.
Article
in En
| MEDLINE
| ID: mdl-28656037
ABSTRACT
This article presents the results of research on multi-layered heterostructures by a modified calculation technique of multiple X-ray diffraction. The Al x In1-x Sb heterostructure and a Zn(Mn)Se/GaAs(001) multi-layered system were used as models to specify conditions for cases of coincidental coplanar three-beam or coincidental noncoplanar four-beam X-ray diffraction. These conditions provide the means for a high-precision determination of lattice parameters and strain anisotropy in layers.
Full text:
1
Database:
MEDLINE
Type of study:
Diagnostic_studies
Language:
En
Year:
2017
Type:
Article