Three-Dimensional Integrated X-ray Diffraction Imaging of a Native Strain in Multi-Layered WSe<sub>2</sub>.

Three-Dimensional Integrated X-ray Diffraction Imaging of a Native Strain in Multi-Layered WSe₂.

Cherukara, Mathew J; Schulmann, Daniel S; Sasikumar, Kiran; Arnold, Andrew J; Chan, Henry; Sadasivam, Sridhar; Cha, Wonsuk; Maser, Jorg; Das, Saptarshi; Sankaranarayanan, Subramanian K R S; Harder, Ross J.

Nano Lett ; 18(3): 1993-2000, 2018 03 14.

Article in En | MEDLINE | ID: mdl-29451799

Key words

3-D strain mapping; Coherent X-ray imaging; WSe2; chalcogenide layered semiconductors; multiscale modeling

Full text: 1 Database: MEDLINE Type of study: Prognostic_studies Language: En Year: 2018 Type: Article

Full text: 1 Database: MEDLINE Type of study: Prognostic_studies Language: En Year: 2018 Type: Article