Swept-Source-Based Chromatic Confocal Microscopy.

Jeong, Dawoon; Park, Se Jin; Jang, Hansol; Kim, Hyunjoo; Kim, Jaesun; Kim, Chang-Seok.

Affiliation

Jeong D; Department of Cogno-Mechatronics Engineering, Pusan National University, Busan 46241, Korea.
Park SJ; Department of Cogno-Mechatronics Engineering, Pusan National University, Busan 46241, Korea.
Jang H; Department of Cogno-Mechatronics Engineering, Pusan National University, Busan 46241, Korea.
Kim H; Taihan Fiber Optics Co., Ltd., Ansan-si 15601, Gyeonggi-do, Korea.
Kim J; Taihan Fiber Optics Co., Ltd., Ansan-si 15601, Gyeonggi-do, Korea.
Kim CS; Department of Cogno-Mechatronics Engineering, Pusan National University, Busan 46241, Korea.

Sensors (Basel) ; 20(24)2020 Dec 21.

Article in En | MEDLINE | ID: mdl-33371378