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Science Opportunities at the SwissFEL X-ray Laser.
Patterson, Bruce D; Beaud, Paul; Braun, Hans H; Dejoiea, Catherine; Ingold, Gerhard; Milne, Christopher; Patthey, Luc; Pedrini, Bill; Szlachentko, Jakub; Abela, Rafael.
Afiliación
  • Patterson BD; SwissFEL Paul Scherrer Institute OVGA 413 CH-5232 Villigen-PSI, Switzerland.
  • Beaud P; SwissFEL Paul Scherrer Institute OVGA 413 CH-5232 Villigen-PSI, Switzerland.
  • Braun HH; SwissFEL Paul Scherrer Institute OVGA 413 CH-5232 Villigen-PSI, Switzerland.
  • Dejoiea C; SwissFEL Paul Scherrer Institute OVGA 413 CH-5232 Villigen-PSI, Switzerland; Laboratorium für Kristallographie ETH Zürich CH-8093 Zürich, Switzerland.
  • Ingold G; SwissFEL Paul Scherrer Institute OVGA 413 CH-5232 Villigen-PSI, Switzerland.
  • Milne C; SwissFEL Paul Scherrer Institute OVGA 413 CH-5232 Villigen-PSI, Switzerland.
  • Patthey L; SwissFEL Paul Scherrer Institute OVGA 413 CH-5232 Villigen-PSI, Switzerland.
  • Pedrini B; SwissFEL Paul Scherrer Institute OVGA 413 CH-5232 Villigen-PSI, Switzerland.
  • Szlachentko J; SwissFEL Paul Scherrer Institute OVGA 413 CH-5232 Villigen-PSI, Switzerland.
  • Abela R; SwissFEL Paul Scherrer Institute OVGA 413 CH-5232 Villigen-PSI, Switzerland. rafael.abela@psi.ch.
Chimia (Aarau) ; 68(1): 73-78, 2014 Feb 26.
Article en En | MEDLINE | ID: mdl-28982442
ABSTRACT
Next-generation X-ray sources, based on the X-ray Free Electron Laser (XFEL) concept, will provide highly coherent, ultrashort pulses of soft and hard X-rays with peak intensity many orders of magnitude higher than that of a synchrotron. These pulses will allow studies of femtosecond dynamics at nanometer resolution and with chemical selectivity. They will produce diffraction images of organic and inorganic nanostructures without deleterious effects of radiation damage.

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2014 Tipo del documento: Article

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2014 Tipo del documento: Article