Quantification of the Electromechanical Measurements by Piezoresponse Force Microscopy.

Buragohain, Pratyush; Lu, Haidong; Richter, Claudia; Schenk, Tony; Kariuki, Pamenas; Glinsek, Sebastjan; Funakubo, Hiroshi; Íñiguez, Jorge; Defay, Emmanuel; Schroeder, Uwe; Gruverman, Alexei.

Afiliación

Buragohain P; Department of Physics and Astronomy, University of Nebraska-Lincoln, Lincoln, NE 68588, USA.
Lu H; Department of Physics and Astronomy, University of Nebraska-Lincoln, Lincoln, NE 68588, USA.
Richter C; NaMLab gGmbH, 01187, Noethnitzer Strasse 64 a, Dresden, Germany.
Schenk T; Ferroelectric Memory GmbH, 01099, Charlotte-Bühler-Str. 12, Dresden, Germany.
Kariuki P; NaMLab gGmbH, 01187, Noethnitzer Strasse 64 a, Dresden, Germany.
Glinsek S; Materials Research and Technology Department, Luxembourg Institute of Science and Technology, 41 Rue du Brill, Belvaux, L-4422, Luxembourg.
Funakubo H; School of Materials and Chemical Technology, Tokyo Institute of Technology, Yokohama, 226-8502, Japan.
Íñiguez J; Materials Research and Technology Department, Luxembourg Institute of Science and Technology, 41 Rue du Brill, Belvaux, L-4422, Luxembourg.
Defay E; Department of Physics and Materials Science, University of Luxembourg, 41 Rue du Brill, Belvaux, L-4422, Luxembourg.
Schroeder U; Materials Research and Technology Department, Luxembourg Institute of Science and Technology, 41 Rue du Brill, Belvaux, L-4422, Luxembourg.
Gruverman A; NaMLab gGmbH, 01187, Noethnitzer Strasse 64 a, Dresden, Germany.