Correlating Optical Microspectroscopy with 4×4 Transfer Matrix Modeling for Characterizing Birefringent Van der Waals Materials.

Schwarz, Julian; Niebauer, Michael; Kolesnik-Gray, Maria; Szabo, Maximilian; Baier, Leander; Chava, Phanish; Erbe, Artur; Krstic, Vojislav; Rommel, Mathias; Hutzler, Andreas

Correlating Optical Microspectroscopy with 4×4 Transfer Matrix Modeling for Characterizing Birefringent Van der Waals Materials.

Schwarz, Julian; Niebauer, Michael; Kolesnik-Gray, Maria; Szabo, Maximilian; Baier, Leander; Chava, Phanish; Erbe, Artur; Krstic, Vojislav; Rommel, Mathias; Hutzler, Andreas.

Afiliación

Schwarz J; Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Electron Devices, Cauerstraße 6, 91058, Erlangen, Germany.
Niebauer M; Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Electron Devices, Cauerstraße 6, 91058, Erlangen, Germany.
Kolesnik-Gray M; Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Applied Physics, Staudtstraße 7, 91058, Erlangen, Germany.
Szabo M; Fraunhofer Institute for Integrated Systems and Device Technology IISB, Schottkystraße 10, 91058, Erlangen, Germany.
Baier L; Fraunhofer Institute for Integrated Systems and Device Technology IISB, Schottkystraße 10, 91058, Erlangen, Germany.
Chava P; Helmholtz-Zentrum Dresden-Rossendorf (HZDR), Institute of Ion Beam Physics and Materials Research, Bautzner Landstrasse 400, 01328, Dresden, Germany.
Erbe A; Helmholtz-Zentrum Dresden-Rossendorf (HZDR), Institute of Ion Beam Physics and Materials Research, Bautzner Landstrasse 400, 01328, Dresden, Germany.
Krstic V; Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Applied Physics, Staudtstraße 7, 91058, Erlangen, Germany.
Rommel M; Fraunhofer Institute for Integrated Systems and Device Technology IISB, Schottkystraße 10, 91058, Erlangen, Germany.
Hutzler A; Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Electron Devices, Cauerstraße 6, 91058, Erlangen, Germany.