Understanding radiation-generated electronic traps in radiation dosimeters based on organic field-effect transistors.

Dremann, Derek; Kumar, Evan J; Thorley, Karl J; Gutiérrez-Fernández, Edgar; Ververs, James D; Bourland, J Daniel; Anthony, John E; Kandada, Ajay Ram Srimath; Jurchescu, Oana D.

Afiliación

Dremann D; Department of Physics and Center for Functional Materials (CFM), Wake Forest University, Winston Salem, NC 27109, USA. jurchescu@wfu.edu.
Kumar EJ; Department of Physics and Center for Functional Materials (CFM), Wake Forest University, Winston Salem, NC 27109, USA. jurchescu@wfu.edu.
Thorley KJ; University of Kentucky Center for Applied Energy Research, Lexington, KY 40511, USA.
Gutiérrez-Fernández E; Department of Physics, University of Warwick, Gibbet Hill Road, Coventry, CV4 7AL, UK.
Ververs JD; XMas/BM28-ESRF, 71 Avenue Des Martyrs, F-38043 Grenoble Cedex, France.
Bourland JD; Department of Radiation Oncology, Wake Forest School of Medicine, Wake Forest University, Winston Salem, NC 27157, USA.
Anthony JE; Department of Physics and Center for Functional Materials (CFM), Wake Forest University, Winston Salem, NC 27109, USA. jurchescu@wfu.edu.
Kandada ARS; Department of Radiation Oncology, Wake Forest School of Medicine, Wake Forest University, Winston Salem, NC 27157, USA.
Jurchescu OD; University of Kentucky Center for Applied Energy Research, Lexington, KY 40511, USA.

Mater Horiz ; 11(1): 134-140, 2024 Jan 02.

Article en En | MEDLINE | ID: mdl-37937385

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2024 Tipo del documento: Article

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2024 Tipo del documento: Article