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High-Performance All-Inorganic Architecture Perovskite Light-Emitting Diodes Based on Tens-of-Nanometers-Sized CsPbBr3 Emitters in a Carrier-Confined Heterostructure.
Gong, Xinquan; Hao, Xiaoming; Si, Junjie; Deng, Yunzhou; An, Kai; Hu, Qianqing; Cai, Qiuting; Gao, Yun; Ke, You; Wang, Nana; Du, Zhuopeng; Cai, Muzhi; Ye, Zhizhen; Dai, Xingliang; Liu, Zugang.
Afiliación
  • Gong X; College of Optical and Electronic Technology, China Jiliang University, Hangzhou 310018, People's Republic of China.
  • Hao X; College of Optical and Electronic Technology, China Jiliang University, Hangzhou 310018, People's Republic of China.
  • Si J; College of Optical and Electronic Technology, China Jiliang University, Hangzhou 310018, People's Republic of China.
  • Deng Y; Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE U.K.
  • An K; College of Optical and Electronic Technology, China Jiliang University, Hangzhou 310018, People's Republic of China.
  • Hu Q; College of Optical and Electronic Technology, China Jiliang University, Hangzhou 310018, People's Republic of China.
  • Cai Q; School of Materials Science and Engineering, State Key Laboratory of Silicon Materials, Zhejiang University, Hangzhou 310027, People's Republic of China.
  • Gao Y; Wenzhou Key Laboratory of Novel Optoelectronic and Nano Materials, Institute of Wenzhou Zhejiang University, Wenzhou 325006, People's Republic of China.
  • Ke Y; School of Materials Science and Engineering, State Key Laboratory of Silicon Materials, Zhejiang University, Hangzhou 310027, People's Republic of China.
  • Wang N; Wenzhou Key Laboratory of Novel Optoelectronic and Nano Materials, Institute of Wenzhou Zhejiang University, Wenzhou 325006, People's Republic of China.
  • Du Z; Shaanxi Institute of Flexible Electronics (SIFE), Xi'an Institute of Biomedical Materials & Engineering (IBME), Northwestern Polytechnical University (NPU) 127 West Youyi Road, Xi'an 710072, People's Republic of China.
  • Cai M; Key Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) & School of Flexible Electronics (Future Technologies), Nanjing Tech University (NanjingTech), 30 South Puzhu Road, Nanjing 211816, People's Republic of China.
  • Ye Z; Key Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) & School of Flexible Electronics (Future Technologies), Nanjing Tech University (NanjingTech), 30 South Puzhu Road, Nanjing 211816, People's Republic of China.
  • Dai X; College of Optical and Electronic Technology, China Jiliang University, Hangzhou 310018, People's Republic of China.
  • Liu Z; College of Optical and Electronic Technology, China Jiliang University, Hangzhou 310018, People's Republic of China.
ACS Nano ; 18(12): 8673-8682, 2024 Mar 26.
Article en En | MEDLINE | ID: mdl-38471123
ABSTRACT
Developing green perovskite light-emitting diodes (PeLEDs) with a high external quantum efficiency (EQE) and low efficiency roll-off at high brightness remains a critical challenge. Nanostructured emitter-based devices have shown high efficiency but restricted ascending luminance at high current densities, while devices based on large-sized crystals exhibit low efficiency roll-off but face great challenges to high efficiency. Herein, we develop an all-inorganic device architecture combined with utilizing tens-of-nanometers-sized CsPbBr3 (TNS-CsPbBr3) emitters in a carrier-confined heterostructure to realize green PeLEDs that exhibit high EQEs and low efficiency roll-off. A typical type-I heterojunction containing TNS-CsPbBr3 crystals and wide-bandgap Cs4PbBr6 within a grain is formed by carefully controlling the precursor ratio. These heterostructured TNS-CsPbBr3 emitters simultaneously enhance carrier confinement and retain low Auger recombination under a large injected carrier density. Benefiting from a simple device architecture consisting of an emissive layer and an oxide electron-transporting layer, the PeLEDs exhibit a sub-bandgap turn-on voltage of 2.0 V and steeply rising luminance. In consequence, we achieved green PeLEDs demonstrating a peak EQE of 17.0% at the brightness of 36,000 cd m-2, and the EQE remained at 15.7% and 12.6% at the brightness of 100,000 and 200,000 cd m-2, respectively. In addition, our results underscore the role of interface degradation during device operation as a factor in device failure.
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Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2024 Tipo del documento: Article

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2024 Tipo del documento: Article