RESUMEN
Extreme ultraviolet (EUV) photon beam characterization techniques, Hartmann wavefront sensing and single shot ablation imprinting, were compared along the caustic of a tightly focused free-electron laser (FEL) beam at beamline FL24 of FLASH2, the Free-electron LASer in Hamburg at DESY. The transverse coherence of the EUV FEL was determined by a Young's double pinhole experiment and used in a back-propagation algorithm which includes partial coherence to calculate the beam intensity profiles along the caustic from the wavefront measurements. A very good agreement of the profile structure and size is observed for different wavelengths between the back-propagated profiles, an indirect technique, and ablation imprints. As a result, the Hartmann wavefront sensor including its software MrBeam is a very useful, single shot pulse resolved and fast tool for non-invasive determination of focal spot size and shape and also for beam profiles along the caustic.
RESUMEN
With high-harmonic generation (HHG), spatially and temporally coherent XUV to soft x-ray (100 nm to 10 nm) table-top sources can be realized by focusing a driving infrared (IR) laser on a gas target. For applications such as coherent diffraction imaging, holography, plasma diagnostics, or pump-probe experiments, it is desirable to have control over the wave front (WF) of the HHs to maximize the number of XUV photons on target or to tailor the WF. Here, we demonstrate control of the XUV WF by tailoring the driving IR WF with a deformable mirror. The WFs of both IR and XUV beams are monitored with WF sensors. We present a systematic study of the dependence of the aberrations of the HHs on the aberrations of the driving IR laser and explain the observations with propagation simulations. We show that we can control the astigmatism of the HHs by changing the astigmatism of the driving IR laser without compromising the HH generation efficiency with a WF quality from λ/8 to λ/13.3. This allows us to shape the XUV beam without changing any XUV optical element.