RESUMEN
Conventional research in structured light measurements has utilized light intensity as a channel for information. The polarization of light can be used as an additional channel of information. In this paper, a method based on the superposition of multiple polarization states is proposed to encode structured light. By building a polarization model between the color of light and the polarization states, polarized structured light containing phase information is obtained without rotating the polarizer. It is demonstrated that the method improves the waveform quality of stripes and the accuracy of the 3D reconstruction results when measuring highly reflective objects.
RESUMEN
Measurement of high dynamic range objects is an obstacle in structured light 3D measurement. They entail both over-exposed and low-exposed pixels in a single exposure. This paper proposed a polarization-enhanced fringe pattern (PEFP) method that a high dynamic range image can be obtained within a single exposure time. The degree of linear polarization (DOLP) is calculated using the polarization properties of reflected light and a linear polarizer in fixed azimuth in this method. The DOLP is efficiently estimated by the projected polarization-state-encode (PSE) pattern, and it does not need to change the state of the polarizer. The DOLP depends on light intensity rather than the reflectivity of the object surfaces indicated in experimental results. The contrast of fringe patterns was enhanced, and the quality of fringe patterns was improved by the proposed method. More sufficient 3D point clouds and high-quality shape can be recovered using this method.