Improved phase sensitivity in spectral domain phase microscopy using line-field illumination and self phase-referencing.
Opt Express
; 17(13): 10681-7, 2009 Jun 22.
Article
en En
| MEDLINE
| ID: mdl-19550464
ABSTRACT
We report a quantitative phase microscope based on spectral domain optical coherence tomography and line-field illumination. The line illumination allows self phase-referencing method to reject common-mode phase noise. The quantitative phase microscope also features a separate reference arm, permitting the use of high numerical aperture (NA > 1) microscope objectives for high resolution phase measurement at multiple points along the line of illumination. We demonstrate that the path-length sensitivity of the instrument can be as good as 41 pm/square root of Hz, which makes it suitable for nanometer scale study of cell motility. We present the detection of natural motions of cell surface and two-dimensional surface profiling of a HeLa cell.
Texto completo:
1
Base de datos:
MEDLINE
Asunto principal:
Tomografía de Coherencia Óptica
/
Microscopía
Tipo de estudio:
Diagnostic_studies
Idioma:
En
Revista:
Opt Express
Asunto de la revista:
OFTALMOLOGIA
Año:
2009
Tipo del documento:
Article