Depth sectioning combined with atom-counting in HAADF STEM to retrieve the 3D atomic structure.

Alania, M; Altantzis, T; De Backer, A; Lobato, I; Bals, S; Van Aert, S.

Afiliación

Alania M; Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
Altantzis T; Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
De Backer A; Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
Lobato I; Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
Bals S; Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
Van Aert S; Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium. Electronic address: sandra.vanaert@uantwerpen.be.

Ultramicroscopy ; 177: 36-42, 2017 06.

Article en En | MEDLINE | ID: mdl-28284056