A Small Spot, Inert Gas, Ion Milling Process as a Complementary Technique to Focused Ion Beam Specimen Preparation.

Fischione, Paul E; Williams, Robert E A; Genç, Arda; Fraser, Hamish L; Dunin-Borkowski, Rafal E; Luysberg, Martina; Bonifacio, Cecile S; Kovács, András.

Afiliación

Fischione PE; 1E.A. Fischione Instruments Inc.,9003 Corporate Circle,Export,PA 15632,USA.
Williams REA; 2Center for the Accelerated Maturation of Materials,The Ohio State University,1305 Kinnear Road,Columbus,OH 43212,USA.
Genç A; 2Center for the Accelerated Maturation of Materials,The Ohio State University,1305 Kinnear Road,Columbus,OH 43212,USA.
Fraser HL; 2Center for the Accelerated Maturation of Materials,The Ohio State University,1305 Kinnear Road,Columbus,OH 43212,USA.
Dunin-Borkowski RE; 3Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute,Forschungszentrum Jülich GmbH,Wilhelm-Johnen-Straße,52425 Jülich,Germany.
Luysberg M; 3Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute,Forschungszentrum Jülich GmbH,Wilhelm-Johnen-Straße,52425 Jülich,Germany.
Bonifacio CS; 1E.A. Fischione Instruments Inc.,9003 Corporate Circle,Export,PA 15632,USA.
Kovács A; 3Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute,Forschungszentrum Jülich GmbH,Wilhelm-Johnen-Straße,52425 Jülich,Germany.

Microsc Microanal ; 23(4): 782-793, 2017 08.

Article en En | MEDLINE | ID: mdl-28625222