Precise method for measuring spatial coherence in TEM beams using Airy diffraction patterns.

Yamasaki, Jun; Shimaoka, Yuki; Sasaki, Hirokazu.

Afiliación

Yamasaki J; Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki 567-0047, Japan.
Shimaoka Y; Department of Electronic Engineering, Osaka University, 2-1 Yamadaoka, Suita 565-0871, Japan.
Sasaki H; Yokohama R&D Lab, Furukawa Electric Co., Ltd., 2-4-3 Okano, Nishi-ku, Yokohama 220-0073, Japan.

Microscopy (Oxf) ; 67(1): 1-10, 2018 Feb 01.

Article en En | MEDLINE | ID: mdl-29140445

Texto completo: 1 Base de datos: MEDLINE Idioma: En Revista: Microscopy (Oxf) Año: 2018 Tipo del documento: Article

Texto completo: 1 Base de datos: MEDLINE Idioma: En Revista: Microscopy (Oxf) Año: 2018 Tipo del documento: Article