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Effects of Asymmetric Local Joule Heating on Silicon Nanowire-Based Devices Formed by Dielectrophoresis Alignment Across Pt Electrodes.
Ho, Hsiang-Hsi; Lin, Chun-Lung; Tsai, Wei-Che; Hong, Liang-Zheng; Lyu, Cheng-Han; Hsu, Hsun-Feng.
Afiliación
  • Ho HH; Department of Materials Science and Engineering, National Chung Hsing University, 145 Xingda Rd, Taichung, 40227, Taiwan.
  • Lin CL; Department of Materials Science and Engineering, National Chung Hsing University, 145 Xingda Rd, Taichung, 40227, Taiwan.
  • Tsai WC; Department of Materials Science and Engineering, National Chung Hsing University, 145 Xingda Rd, Taichung, 40227, Taiwan.
  • Hong LZ; Department of Materials Science and Engineering, National Chung Hsing University, 145 Xingda Rd, Taichung, 40227, Taiwan.
  • Lyu CH; Department of Materials Science and Engineering, National Chung Hsing University, 145 Xingda Rd, Taichung, 40227, Taiwan.
  • Hsu HF; Department of Materials Science and Engineering, National Chung Hsing University, 145 Xingda Rd, Taichung, 40227, Taiwan. hfhsu@dragon.nchu.edu.tw.
Nanoscale Res Lett ; 13(1): 21, 2018 Jan 16.
Article en En | MEDLINE | ID: mdl-29349636
We demonstrate the fabrication and characterization of silicon nanowire-based devices in metal-nanowire-metal configuration using direct current dielectrophoresis. The current-voltage characteristics of the devices were found rectifying, and their direction of rectification could be determined by voltage sweep direction due to the asymmetric Joule heating effect that occurred in the electrical measurement process. The photosensing properties of the rectifying devices were investigated. It reveals that when the rectifying device was in reverse-biased mode, the excellent photoresponse was achieved due to the strong built-in electric field at the junction interface. It is expected that rectifying silicon nanowire-based devices through this novel and facile method can be potentially applied to other applications such as logic gates and sensors.
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Texto completo: 1 Base de datos: MEDLINE Idioma: En Revista: Nanoscale Res Lett Año: 2018 Tipo del documento: Article

Texto completo: 1 Base de datos: MEDLINE Idioma: En Revista: Nanoscale Res Lett Año: 2018 Tipo del documento: Article