Thickness and Stacking Sequence Determination of Exfoliated Dichalcogenides (1T-TaS2, 2H-MoS2) Using Scanning Transmission Electron Microscopy.

Hovden, Robert; Liu, Pengzi; Schnitzer, Noah; Tsen, Adam W; Liu, Yu; Lu, Wenjian; Sun, Yuping; Kourkoutis, Lena F.

Afiliación

Hovden R; 1School of Applied and Engineering Physics,Cornell University,Ithaca,NY 14853,USA.
Liu P; 1School of Applied and Engineering Physics,Cornell University,Ithaca,NY 14853,USA.
Schnitzer N; 2Department of Materials Science & Engineering,University of Michigan,Ann Arbor,MI48109,USA.
Tsen AW; 3Department of Chemistry,University of Waterloo,Waterloo,ON,Canada,N2L 3G1.
Liu Y; 4Key Laboratory of Materials Physics,Chinese Academy of Sciences,Hefei 230031,China.
Lu W; 4Key Laboratory of Materials Physics,Chinese Academy of Sciences,Hefei 230031,China.
Sun Y; 4Key Laboratory of Materials Physics,Chinese Academy of Sciences,Hefei 230031,China.
Kourkoutis LF; 1School of Applied and Engineering Physics,Cornell University,Ithaca,NY 14853,USA.

Microsc Microanal ; 24(4): 387-395, 2018 08.

Article en En | MEDLINE | ID: mdl-30175707