Hidden Markov model for atom-counting from sequential ADF STEM images: Methodology, possibilities and limitations.

De Wael, Annelies; De Backer, Annick; Van Aert, Sandra

De Wael, Annelies; De Backer, Annick; Van Aert, Sandra.

Afiliación

De Wael A; EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium; NANOlab Center of Excellence, University of Antwerp, Belgium.
De Backer A; EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium; NANOlab Center of Excellence, University of Antwerp, Belgium.
Van Aert S; EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium; NANOlab Center of Excellence, University of Antwerp, Belgium. Electronic address: sandra.vanaert@uantwerpen.be.

Ultramicroscopy ; 219: 113131, 2020 Dec.

Article en En | MEDLINE | ID: mdl-33091707

Palabras clave

Atom-counting; Dynamic structural changes; Quantitative electron microscopy; Scanning transmission electron microscopy

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Texto completo: 1 Base de datos: MEDLINE Tipo de estudio: Health_economic_evaluation / Prognostic_studies Idioma: En Revista: Ultramicroscopy Año: 2020 Tipo del documento: Article

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