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Polarized X-ray scattering measures molecular orientation in polymer-grafted nanoparticles.
Mukherjee, Subhrangsu; Streit, Jason K; Gann, Eliot; Saurabh, Kumar; Sunday, Daniel F; Krishnamurthy, Adarsh; Ganapathysubramanian, Baskar; Richter, Lee J; Vaia, Richard A; DeLongchamp, Dean M.
Afiliación
  • Mukherjee S; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA.
  • Streit JK; Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright Patterson Air Force Base, OH, USA.
  • Gann E; UES, Inc., Dayton, OH, USA.
  • Saurabh K; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA.
  • Sunday DF; Department of Mechanical Engineering, Iowa State University, Ames, IA, USA.
  • Krishnamurthy A; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA.
  • Ganapathysubramanian B; Department of Mechanical Engineering, Iowa State University, Ames, IA, USA.
  • Richter LJ; Department of Mechanical Engineering, Iowa State University, Ames, IA, USA.
  • Vaia RA; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA.
  • DeLongchamp DM; Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright Patterson Air Force Base, OH, USA.
Nat Commun ; 12(1): 4896, 2021 08 12.
Article en En | MEDLINE | ID: mdl-34385430
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Texto completo: 1 Base de datos: MEDLINE Idioma: En Revista: Nat Commun Asunto de la revista: BIOLOGIA / CIENCIA Año: 2021 Tipo del documento: Article
Texto completo
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XML
PubMed Links
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Texto completo: 1 Base de datos: MEDLINE Idioma: En Revista: Nat Commun Asunto de la revista: BIOLOGIA / CIENCIA Año: 2021 Tipo del documento: Article