Structural measurement of electron-phonon coupling and electronic thermal transport across a metal-semiconductor interface.

Jo, Wonhyuk; Kee, Jungyun; Kim, Kooktea; Landahl, Eric C; Longbons, Grace; Walko, Donald A; Wen, Haidan; Lee, Dong Ryeol; Lee, Sooheyong.

Afiliación

Jo W; Korea Research Institute of Standards and Science, Daejeon, 305-340, South Korea.
Kee J; Department of Physics, Soongsil University, Seoul, 06978, South Korea.
Kim K; European X-ray Free Electron Laser GmbH, Schenefeld, 22869, Germany.
Landahl EC; Department of Physics, Soongsil University, Seoul, 06978, South Korea.
Longbons G; Center for Spintronics, Korea Institute of Science and Technology, Seoul, 02792, South Korea.
Walko DA; Department of Physics, Soongsil University, Seoul, 06978, South Korea.
Wen H; Department of Physics and Astrophysics, DePaul University, Chicago, IL, 60614, USA.
Lee DR; Department of Physics and Astrophysics, DePaul University, Chicago, IL, 60614, USA.
Lee S; Physics Department, University of Notre Dame, Notre Dame, IN, USA.

Sci Rep ; 12(1): 16606, 2022 Oct 05.

Article en En | MEDLINE | ID: mdl-36198711

Texto completo: 1 Base de datos: MEDLINE Idioma: En Revista: Sci Rep Año: 2022 Tipo del documento: Article

Texto completo: 1 Base de datos: MEDLINE Idioma: En Revista: Sci Rep Año: 2022 Tipo del documento: Article