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Electron Temperature Measurements Using a Two-Filter Soft X-ray Array in VEST.
Lee, M W; Lim, S; Jeong, W; Kim, S; Kim, J H; Hwang, Y S; Sung, C.
Afiliación
  • Lee MW; Department of Nuclear and Quantum Engineering, Korea Advanced Institute of Science and Technology, Daejeon 34141, Republic of Korea.
  • Lim S; Department of Energy Systems Engineering, Seoul National University, Seoul 08826, Republic of Korea.
  • Jeong W; Department of Energy Systems Engineering, Seoul National University, Seoul 08826, Republic of Korea.
  • Kim S; Department of Energy Systems Engineering, Seoul National University, Seoul 08826, Republic of Korea.
  • Kim JH; Department of Energy Systems Engineering, Seoul National University, Seoul 08826, Republic of Korea.
  • Hwang YS; Department of Energy Systems Engineering, Seoul National University, Seoul 08826, Republic of Korea.
  • Sung C; Department of Nuclear and Quantum Engineering, Korea Advanced Institute of Science and Technology, Daejeon 34141, Republic of Korea.
Sensors (Basel) ; 23(20)2023 Oct 10.
Article en En | MEDLINE | ID: mdl-37896452
ABSTRACT
A multichannel soft X-ray (SXR) array has been developed to measure the electron temperature in the Versatile Experiment Spherical Torus (VEST). To estimate electron temperature using the two-filter method applied to SXR intensity, we designed a pinhole camera that has two photodiode arrays with different metallic filters. We also adopted a filter wheel and tested various filter parameters to find the optimal filter set. Through tests, the combination of aluminum and beryllium was found to be the most suitable for the current experimental conditions in VEST. The filtered SXR signals were acquired with a low-noise preamplifier, exhibiting sufficient signal-to-noise ratios for electron temperature estimation based on the intensity ratio of two signals obtained with different filters. The estimated electron temperature from the developed two-filter SXR array showed reasonably matched levels and consistent trends with Thomson scattering measurements. Error contribution from impurity line emission is also discussed.
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Texto completo: 1 Base de datos: MEDLINE Idioma: En Revista: Sensors (Basel) Año: 2023 Tipo del documento: Article

Texto completo: 1 Base de datos: MEDLINE Idioma: En Revista: Sensors (Basel) Año: 2023 Tipo del documento: Article