Time-Resolved Structural Measurement of Thermal Resistance across a Buried Semiconductor Heterostructure Interface.

Lee, Joohyun; Jo, Wonhyuk; Kwon, Ji-Hwan; Griffin, Bruce; Cho, Byeong-Gwan; Landahl, Eric C; Lee, Sooheyong.

Afiliación

Lee J; Korea Research Institute of Standards and Science, Daejeon 34113, Republic of Korea.
Jo W; European X-ray Free-Electron Laser GmbH, 22869 Schenefeld, Germany.
Kwon JH; Korea Research Institute of Standards and Science, Daejeon 34113, Republic of Korea.
Griffin B; Department of Nano Convergence Measurement, Korea University of Science and Technology, Daejeon 305-340, Republic of Korea.
Cho BG; Department of Physics and Astrophysics, DePaul University, Chicago, IL 60614, USA.
Landahl EC; Korea Research Institute of Standards and Science, Daejeon 34113, Republic of Korea.
Lee S; Department of Physics and Astrophysics, DePaul University, Chicago, IL 60614, USA.

Materials (Basel) ; 16(23)2023 Nov 30.

Article en En | MEDLINE | ID: mdl-38068194