Comprehensive assessment of nonuniform image quality: Application to imaging near metal.

Toews, Alexander R; Lee, Philip K; Nayak, Krishna S; Hargreaves, Brian A

Toews, Alexander R; Lee, Philip K; Nayak, Krishna S; Hargreaves, Brian A.

Afiliación

Toews AR; Radiology, Stanford University, Stanford, California, USA.
Lee PK; Electrical Engineering, Stanford University, Stanford, California, USA.
Nayak KS; Radiology, Stanford University, Stanford, California, USA.
Hargreaves BA; Ming Hsieh Department of Electrical and Computer Engineering, University of Southern California, Los Angeles, California, USA.

Magn Reson Med ; 2024 Jul 12.

Article en En | MEDLINE | ID: mdl-38997797

Palabras clave

image quality; metal; phantom; point spread function; spatial resolution; susceptibility artifact

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Texto completo: 1 Base de datos: MEDLINE Idioma: En Revista: Magn Reson Med Asunto de la revista: DIAGNOSTICO POR IMAGEM Año: 2024 Tipo del documento: Article

Texto completo

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PubMed Links

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Texto completo: 1 Base de datos: MEDLINE Idioma: En Revista: Magn Reson Med Asunto de la revista: DIAGNOSTICO POR IMAGEM Año: 2024 Tipo del documento: Article